Tag: Quantum Design.
Ellipsometry measures a change in polarisation as light reflects or transmits from a material structure. The polarisation change is represented as an amplitude ratio, Ψ, and the phase difference, Δ. The measured response depends on optical properties and thickness of individual materials. Thus, ellipsometry is primarily used to determine film thickness and optical constants. However,... Read more »
J A Woollam alpha SE Spectroscopic Ellipsometer – for spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. With fast measurement speed and push-button operation, the... Read more »