Colorimetry

What is Ellipsometry?

Ellipsometry measures a change in polarisation as light reflects or transmits from a material structure. The polarisation change is represented as an amplitude ratio, Ψ, and the phase difference, Δ. The measured response depends on optical properties and thickness of individual materials. Thus, ellipsometry is primarily used to determine film thickness and optical constants. However, it is also applied to characterise composition, crystallinity, roughness, doping concentration, and other material properties associated with a change in optical response.

Since the 1960s, as ellipsometry developed to provide the sensitivity necessary to measure nanometer-scale layers used in microelectronics, interest in ellipsometry has grown steadily. Today, the range of its applications has spread to the basic research in optical coating, physical sciences, semiconductor and data storage solutions, flat panel display, communication, biosensor industries. This widespread use is explained by increased dependence on thin films in many areas and the flexibility of ellipsometry to measure most material types: biological coatings, composites of materials, dielectrics, semiconductors, metals, superconductors and organics.  Find out more about J A Woollam at https://youtu.be/szkqdcoclkQ.  The UK Distributor, Quantum Design UK hold annual workshops which include an introduction, fundamentals of ellipsometric data analysis, and an overview of ellipsometric applications in both research and production.  Contact Angela Carslake for more information on the next workshop and register your interest.

alpha SE Spectroscopic Ellipsometer

J A Woollam alpha SE Spectroscopic Ellipsometer –
for spectral range of 380-900 nm

For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds.

With fast measurement speed and push-button operation, the alpha-SE® is ideal for qualifying thin films. Single-layer dielectrics on silicon or glass substrates can be measured in seconds.

Coatings on Glass:  Patented technology allows accurate measurements on any substrate: metal, semiconductor, or glass. On transparent substrates, the alpha-SE® measures depolarisation to correct for light returning from the backside of the substrate. This unwanted light can confuse other ellipsometers, but the alpha-SE® ensures accurate optical constants.

Key Features:

  • Easy to use:  Push-button operation is complemented by advanced software that takes care of the work for you
  • Proven spectroscopic ellipsometer technology gives you both thickness and index with much higher certainty than other techniques
  • Works with your materials – dielectrics, semiconductors, organics, and more
  • Spectroscopic ellipsometry for simple sample systems
  • Hundreds of wavelengths simultaneously collected in seconds for immediate results

Quantum Design represent J A Woollam in the UK and Ireland.  Please contact Shayz Ikram for more information on the alpha-SE ellipsometer.

Introduction to the alpha-SE Spectroscopic Ellipsometer

Press Releases

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